Title:

Test Time Optimization Technique for IEEE 802.15.4z Ultra-Wideband Integrated Circuits, Journal of Telecommunications and Information Technology, 2024, nr 3

Group publication title:

2024, nr 3, JTIT-artykuły

Creator:

Tsaturyan, Grigor ; Gomtsyan, Hovhannes

Subject and Keywords:

interframe spacing ; packet generation ; RF circuit testing ; sensitivity measurements ; test time reduction ; UWB

Abstrakt:

IEEE 802.15.4z-compliant ultra-wideband (UWB) devices are becoming ever more popular in contemporary radio engineering systems. Such systems are capable of precisely measuring distances (with their accuracy expressed in centimeters), are immune to interference, offer low latency and transmit data in an energy-efficient manner. Widespread adoption of UWB technology has triggered significant demand for testing integrated circuits these systems rely on, prompting the development of new testing methods to meet the ever increasing requirements in terms of testing speed and reliability. The same applies to sensitivity tests, in the course of which up to 2000 different packets may be received. The process of generating and analyzing such a large number of packets is time consuming. Furthermore, if multiple devices need to be tested simultaneously, the duration of the test will be multiplied accordingly. In such a context, the article investigates the lead time required to generate 2000 UWB packets using conventional methods and proposes a novel approach to significantly reduce packet generation time and improve testing efficiency.

Number:

3

Publisher:

National Institute of Telecommunications

Date:

2024, nr 3

Resource Type:

artykuł

Resource Identifier:

ISSN 1509-4553, on-line: ISSN 1899-8852

DOI:

10.26636/jtit.2024.3.1623

ISSN:

1509-4553

eISSN:

1899-8852

Source:

Journal of Telecommunications and Information Technology

Language:

ang

License:

CC BY 4.0

rights owner:

Instytut Łączności - Państwowy Instytut Badawczy