Diagnostics of micro- and nanostructure using the scanning probe microscopy, Journal of Telecommunications and Information Technology, 2005, nr 1

Edition name	Date
Gotszalk, Teodor; Janus, Paweł; Marendziak, Andrzej; Czarnecki, Piotr; Radojewski, Jacek; Szeloch, Roman F.; Grabiec, Piotr; Rangelow, Ivo W., Diagnostics of micro- and nanostructure using the scanning probe microscopy, Journal of Telecommunications and Information Technology, 2005, nr 1	Jun 11, 2024

Beck, Romuald B. Grabiec, Piotr Gotszalk, Teodor Rangelow, Ivo W. Domański, Krzysztof Dębski, Tomasz

2001, nr 1

artykuł

Application of scanning shear-force microscope for fabrication of nanostructures, Journal of Telecommunications and Information Technology, 2005, nr 1

Sikora, Andrzej Gotszalk, Teodor Rangelow, Ivo W. Sankowska, Anna

2005, nr 1

artykuł

Piezoresistive sensors for atomic force microscopy – numerical simulations by means of virtual wafer fab, Journal of Telecommunications and Information Technology, 2001, nr 1

Jakubowski, Andrzej Tomaszewski, Daniel Grabiec, Piotr Rangelow, Ivo W. Domański, Krzysztof Barth, Wolfgang Dębski, Tomasz

2001, nr 1

artykuł

Multi-Domain Modeling and Simulations of the Heterogeneous Systems, Journal of Telecommunications and Information Technology, 2010, nr 1

Bieniek, Tomasz Tomaszewski, Daniel Grabiec, Piotr Janus, Paweł Kociubiński, Andrzej Malinowski, Arkadiusz Ekwińska, Magdalena Janczyk, Grzegorz Szynka, Jerzy

2010, nr 1

artykuł

Fabrication and properties of the field emission array with self-alignment gate electrode, Journal of Telecommunications and Information Technology, 2001, nr 1

Jakubowski, Andrzej Grabiec, Piotr Zaborowski, Michał Rangelow, Ivo W. Barth, Wolfgang Dębski, Tomasz Hudek, Peter Biehl, Steffen Studzińska, Krystyna Kostic, Ivan Mitura, Stanisław

2001, nr 1

artykuł

Modeling, Simulation and Calibration of Silicon Wet Etching, Journal of Telecommunications and Information Technology, 2009, nr 4

Bieniek, Tomasz Janus, Paweł Kociubiński, Andrzej Duk, Mariusz

2009, nr 4

artykuł

Si-Based Electrodes for Potentiometric Measurements of Aqueous Solutions, Journal of Telecommunications and Information Technology, 2009, nr 4

Tomaszewski, Daniel Jaroszewicz, Bohdan Grabiec, Piotr Zaborowski, Michał

2009, nr 4

artykuł

A versatile tool for extraction of MOSFETs parameters, Journal of Telecommunications and Information Technology, 2005, nr 1

Tomaszewski, Daniel Grabiec, Piotr Marczewski, Jacek Domański, Krzysztof Kucharski, Krzysztof Kociubiński, Andrzej

2005, nr 1

artykuł

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