Instytut Łączności – Państwowy Instytut Badawczy contains 2 262 digital objects
Object
Title: Comparison of gate leakage current components in metal-insulator-semiconductor structures with high-k gate dielectrics, Journal of Telecommunications and Information Technology, 2001, nr 1
Creator:
Jakubowski, Andrzej ; Majkusiak, Bogdan ; Korwin-Pawłowski, Michał ; Janik, Tomasz
Date:
Resource Type:
Description:
Publisher:
Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Format:
Resource Identifier:
oai:bc.itl.waw.pl:691 ; ISSN 1509-4553, on-line: ISSN 1899-8852
DOI:
ISSN:
eISSN:
Source:
Journal of Telecommunications and Information Technology
Language:
Rights Management:
Biblioteka Naukowa Instytutu Łączności
Object collections:
- Digital Library
- Digital Library > Institute's Publications
- Digital Library > Institute's Publications > Current Publications > Journal of Telecommunications and Information Technology (JTIT)
Last modified:
May 20, 2024
In our library since:
Apr 27, 2010
Number of object content hits:
290
All available object's versions:
https://ribes-54.man.poznan.pl/publication/767
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