Instytut Łączności – Państwowy Instytut Badawczy contains 2 275 digital objects
Object
Title: The influence of yield model parameters on the probability of defect occurrence, Journal of Telecommunications and Information Technology, 2007, nr 3
Description:
Publisher:
Instytut Łączności - Państwowy Instytut Badawczy, Warszawa
Format:
Resource Identifier:
DOI:
ISSN:
eISSN:
Source:
Journal of Telecommunications and Information Technology
Language:
Rights Management:
Biblioteka Naukowa Instytutu Łączności
Object collections:
- Digital Library
- Digital Library > Institute's Publications
- Digital Library > Institute's Publications > Current Publications > Journal of Telecommunications and Information Technology (JTIT)
Last modified:
Jul 24, 2024
In our library since:
Jan 28, 2010
Number of object content hits:
222
All available object's versions:
https://ribes-54.man.poznan.pl/publication/339
Show description in RDF format:
Show description in OAI-PMH format:
×